Author Info
Name
Affiliation
Papers
MIN-HYE HO
Samsung Electronics, Yongin, Korea
1
Collaborators
Citations 
PageRank 
5
0
0.34
Referers 
Referees 
References 
0
0
0
Title
Citations
PageRank
Year
Dynamic Voltage Stress Sensing Circuits for Screening Out Early Device Reliability Issues in Advanced Technology Nodes00.342021