Author Info
Name
Affiliation
Papers
KAZUMA ARIYOSHI
Graduate School of Kyushu Institute of Technology, Kitakyushu, Japan
1
Collaborators
Citations 
PageRank 
2
0
0.34
Referers 
Referees 
References 
0
5
2
Title
Citations
PageRank
Year
Comparisons of instability in device characteristics at high temperature for thin-film SOI power n- and p- channel MOSFETs00.342020