Author Info
Name
Affiliation
Papers
S. MBAREK
Normandie Univ, UNIROUEN, INSA Rouen, CNRS, Groupe de Physique des Matériaux, 76000 Rouen, France
1
Collaborators
Citations 
PageRank 
4
0
0.34
Referers 
Referees 
References 
0
0
0
Title
Citations
PageRank
Year
Gate oxide degradation of SiC MOSFET under short-circuit aging tests.00.342016