Author Info
Name
Affiliation
Papers
A. ELSAYED
Institute of Semiconductor Engineering (IHT), University of Stuttgart, Stuttgart, Germany
2
Collaborators
Citations 
PageRank 
4
1
0.96
Referers 
Referees 
References 
3
0
0
Title
Citations
PageRank
Year
Electrical Characterization of Low-Temperature Boron on Silicon Deposition utilizing Molecular Beam Epitaxy10.632019
Electrical Characterization of pure Boron-on-Germanium pin Diodes00.342019