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S. P. NEO
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Name
Affiliation
Papers
S. P. NEO
Product, Test and Failure AnalysisGlobalfoundriesSingapore
1
Collaborators
Citations
PageRank
8
0
0.34
Referers
Referees
References
0
6
1
Publications (1 rows)
Collaborators (8 rows)
Referers (0 rows)
Referees (6 rows)
Title
Citations
PageRank
Year
Application of Scanning Capacitance Microscopy on SOI device with wafer edge low yield pattern.
0
0.34
2017
1