Author Info
Name
Affiliation
Papers
MITSUNORI KATSU
Ehime University, Matsuyama, Japan
1
Collaborators
Citations 
PageRank 
5
2
0.39
Referers 
Referees 
References 
7
14
3
Title
Citations
PageRank
Year
Testing of Interconnect Defects in Memory Based Reconfigurable Logic Device (MRLD)20.392017