Author Info
Name
Affiliation
Papers
MICHEL COMBAL
STMicroelectronics, Proc Control Dept, Rousset, France
1
Collaborators
Citations 
PageRank 
4
0
0.34
Referers 
Referees 
References 
0
0
0
Title
Citations
PageRank
Year
From Alarm System Events Towards Quality Inspection of The Final Product: Application to a Semiconductor Industry00.342021