Author Info
Name
Affiliation
Papers
JEFFERY LAM
Product, Test and Failure Analysis, GlobalFoundriesSingapore
1
Collaborators
Citations 
PageRank 
8
0
0.34
Referers 
Referees 
References 
0
0
0
Title
Citations
PageRank
Year
Embed SRAM IDDOFF fail root cause identification by combination of device analysis and localized circuit analysis.00.342017