Keith A. Jenkins - Citegraph

Author Info

Name	Affiliation	Papers
KEITH A. JENKINS	IBM T.J. Watson Research Center, NY	15
Collaborators	Citations	PageRank
43	56	7.98
Referers	Referees	References
174	235	59

Search Limit

100235

Publications (15 rows)

Collaborators (43 rows)

Referers (100 rows)

Referees (100 rows)

Title	Citations	PageRank	Year
Long-term data for BTI degradation in 32nm IBM microprocessor using HKMG technology	2	0.42	2015
A Ring-Oscillator-Based Reliability Monitor for Isolated Measurement of NBTI and PBTI in High-k/Metal Gate Technology	4	0.54	2015
Long-term NBTI degradation under real-use conditions in IBM microprocessors.	2	0.38	2014
On-chip circuit to monitor long-term NBTI and PBTI degradation.	1	0.43	2013
A simple array-based test structure for the AC variability characterization of MOSFETs	2	0.40	2011
A Local Random Variability Detector With Complete Digital On-Chip Measurement Circuitry	10	0.97	2009
A Scalable, Digital BIST Circuit for Measurement and Compensation of Static Phase Offset	5	0.62	2009
Experimental Analysis of Substrate Noise Effect on PLL Performance	7	0.72	2008
An On-Chip Test Structure and Digital Measurement Method for Statistical Characterization of Local Random Variability in a Process	5	0.75	2008
On-Chip Spectrum Analyzer for Analog Built-In Self Test	9	0.68	2005
CMOS IC diagnostics using the luminescence of OFF-state leakage currents	0	0.34	2004
Delay Chain Based Programmable Jitter Generator	1	0.38	2004
Measuring Jitter and Phase Error in Microprocessor Phase-Locked Loops	8	0.68	2000
Designing a testable system on a chip	0	0.34	1998
Detecting and Preventing Measurement Errors	0	0.34	1997

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