Thickness Measurement of Oxide and Carbonaceous Layers on a 28Si Sphere by XPS. | 0 | 0.34 | 2017 |
Surface layer analysis of Si sphere by XRF and XPS | 1 | 0.48 | 2015 |
Study of the relationship between peer-to-peer systems and IP multicasting | 12 | 1.23 | 2003 |
Satellite communication system integrated into terrestrial ISDN. | 0 | 0.34 | 2000 |