Novelty detection for the inspection of light-emitting diodes | 3 | 0.42 | 2012 |
Statistical Fourier Descriptors for Defect Image Classification | 2 | 0.37 | 2010 |
Optical Inspection of Welding Seams. | 1 | 0.35 | 2009 |
Fast model selection for MaxMinOver-based training of support vector machines | 1 | 0.36 | 2008 |
Simple Incremental One-Class Support Vector Classification | 4 | 0.48 | 2008 |