Author Info
Name
Affiliation
Papers
MICHELE ESPOSTO
Department of Information Engineering, University of Modena and Reggio Emilia, Strada Vignolese 905, I–41125 Modena MO, Italy
1
Collaborators
Citations 
PageRank 
6
0
0.34
Referers 
Referees 
References 
0
4
1
Title
Citations
PageRank
Year
Experimental and simulated dc degradation of GaN HEMTs by means of gate-drain and gate-source reverse bias stress00.342010