Author Info
Name
Papers
Collaborators
RUNG-CHUAN LIN
2
6
Citations 
PageRank 
Referers 
23
5.17
68
Referees 
References 
18
7
Title
Citations
PageRank
Year
A virtual metrology scheme for predicting CVD thickness in semiconductor manufacturing224.772006
Design and implementation of an intelligent prognostics system10.402005