T.P. Gotszalk - Citegraph

Author Info

Name	Affiliation	Papers
T.P. GOTSZALK	Faculty of Microsystem Electronics and Fotonics, Wroclaw University of Technology, Wybrzeze Wyspianskiego 27; 50-370 Wroclaw, Poland	7
Collaborators	Citations	PageRank
37	4	2.92
Referers	Referees	References
16	51	8

Publications (7 rows)

Collaborators (37 rows)

Referers (16 rows)

Referees (51 rows)

Title	Citations	PageRank	Year
Sensitivity Improvement to Active Piezoresistive AFM Probes Using Focused Ion Beam Processing.	0	0.34	2019
Optimal Design of Electromagnetically Actuated MEMS Cantilevers.	0	0.34	2018
Self-supporting graphene films and their applications.	0	0.34	2015
The regularized blind tip reconstruction algorithm as a scanning probe microscopy tip metrology method	0	0.34	2011
Standard and self-sustained magnetron sputtering deposited Cu films investigated by means of AFM and XRD	1	0.64	2011
Data Modeling For Tools And Technologies For The Analysis And Synthesis Of Nanostructures (Tasnano) Project	2	0.45	2009
Scanning Thermal Microscopy in Microsystem Reliability Analysis	1	0.48	2002

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