Author Info
Name
Affiliation
Papers
W. GOES
Institut for Microelectronics, TU Wien Gusshausstr. 27-29, A-1040 Wien, Austria
3
Collaborators
Citations 
PageRank 
23
1
1.16
Referers 
Referees 
References 
8
21
3
Title
Citations
PageRank
Year
Finite Element Method Approach to MRAM Modeling00.342021
Characterization and modeling of charge trapping: From single defects to devices10.492014
VSP – A gate stack analyzer00.342007