Author Info
Name
Affiliation
Papers
JUN YAMASHITA
Univ Tokushima, Inst Sci & Technol, Tokushima 7708506, Japan
1
Collaborators
Citations 
PageRank 
3
1
0.37
Referers 
Referees 
References 
5
31
9
Title
Citations
PageRank
Year
Sat-Based Test Generation For Open Faults Using Fault Excitation Caused By Effect Of Adjacent Lines10.372013