Author Info
Name
Affiliation
Papers
JIE WU
Department of Electrical and Computer Engineering and the Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, 1308 W. Main Street, Urbana, IL 61801, USA
1
Collaborators
Citations 
PageRank 
1
2
1.69
Referers 
Referees 
References 
13
3
1
Title
Citations
PageRank
Year
Trap generation and breakdown processes in very thin gate oxides21.692001