Name
Affiliation
Papers
EIJI FUJIWARA
Tokyo Inst Technol, Grad Sch Informat Sci & Engn, Meguro Ku, Tokyo 1528552, Japan
41
Collaborators
Citations 
PageRank 
21
180
31.14
Referers 
Referees 
References 
296
277
189
Search Limit
100296
Title
Citations
PageRank
Year
Macwilliams Identity For M-Spotty Weight Enumerator30.472010
Joint source-cryptographic-channel coding for dependable systems00.342009
A Class Of Array Codes Correcting A Cluster Of Unidirectional Errors For Two-Dimensional Matrix Symbols00.342009
M-Ary Substitution/Deletion/Insertion/Adjacent-Symbol-Transposition Error Correcting Codes For Data Entry Systems00.342009
Three-Level Error Control Coding for Dependable Solid-State Drives10.372008
Nonbinary single-symbol error correcting, adjacent two-symbol transposition error correcting codes over integer rings00.342007
Reconstruction of Erasure Correcting Codes for Dependable Distributed Storage System without Spare Disks00.342007
A General Class of M-Spotty Byte Error Control Codes101.342007
Joint source-cryptographic-channel coding based on linear block codes20.422007
Low-Density Triple-Erasure Correcting Codes for Dependable Distributed Storage Systems30.682006
Complex M-Spotty Byte Error Control Codes00.342006
Parallel Decoding Cyclic Burst Error Correcting Codes40.572005
Transient Behavior of the Encoding/Decoding Circuits of Error Correcting Codes10.412005
A Class of M-Ary Asymmetric Symbol Error Correcting Codes for Data Entry Devices61.182004
Nonsystematic M-Ary Asymmetric Error Correcting Codes Designed by Multilevel Coding Method10.412004
A Class Of Codes For Correcting Single Spotty Byte Errors20.372003
Array Codes Correcting a Cluster of Unidirectional Errors for Two-Dimensional Matrix Symbols10.392003
A class of random multiple bits in a byte error correcting and single byte error detecting (Stb/EC-SbED) codes192.392003
Two-Level Unequal Error Protection Codes With Burst And Bit Error Correcting Capabilities00.342002
A Class of Random Multiple Bits in a Byte Error Correcting (S t/b EC)Codes for Semiconductor Memory Systems10.682002
Unequal Error Protection Codes with Two-Level Burst and Bit Error Correcting Capabilities20.442001
A Class Of Systematic T/B-Error Correcting Codes For Semiconductor Memory Systems00.342001
A class of systematic m-ary single-symbol error correcting codes30.752001
Evaluations of burst error recovery for VF arithmetic coding00.342000
Single Byte Error Control Codes with Double Bit within a Block Error Correcting Capability for Semiconductor Memory Systems10.482000
Systematic Deletion/Insertion Error Correcting Codes with Random Error Correction Capability60.711999
Optimal Two-Level Unequal Error Control Codes for Computer Systems20.481998
A Class of Error Control Codes for Byte Organized Memory Systems -SbEC-(Sb+S)ED Codes-50.711997
Reliable Logic Circuits with Byte Error Control Codes: A Feasibility Study.50.561996
Probability to achieve TSC goal171.751996
Defect-Tolerant Wsi File Memory System Using Address Permutation For Spare Allocation00.341995
Fault-tolerant associate memories10.371995
Defect-Tolerant WSI File Memory System Using Address Permutation for Spare Allocation.00.341995
A Probabilistic Measurement for Totally Self-Checking Circuits40.551993
A class of error-locating codes for byte-organized memory systems30.441993
A Defect-Tolerant WSI File Memory System Using Address Permutation Scheme for Spare Allocation00.341993
Single b-bit byte error correcting and double bit error detecting codes for high-speed memory systems82.211992
Error-Control Coding in Computers344.561990
Fault - tolerant k - out - of - n logic unit networks.00.341988
Masking asymmetric line faults using semi-distance codes.61.001988
A self-checking generalized prediction checker and its use for built-in testing292.071987