Author Info
Name
Affiliation
Papers
JI HWAN (PAUL) CHUN
Intel Corporation, Austin, TX and The University of Texas at Austin, Austin, TX
5
Collaborators
Citations 
PageRank 
5
16
2.39
Referers 
Referees 
References 
26
74
31
Title
Citations
PageRank
Year
Indirect method for random jitter measurement on SoCs using critical path characterization00.342012
A novel characterization technique for high speed I/O mixed signal circuit components using random jitter injection00.342010
Optimized Signature-Based Statistical Alternate Test for Mixed-Signal Performance Parameters50.472006
An efficient linearity test for on-chip high speed ADC and DAC using loop-back50.702004
Performance characterization of mixed-signal circuits using a ternary signal representation60.542004