Name
Papers
Collaborators
WEIPING SHI
79
118
Citations 
PageRank 
Referers 
685
63.00
1083
Referees 
References 
915
720
Search Limit
1001000
Title
Citations
PageRank
Year
Layout Capacitance Extraction Using Automatic Pre-Characterization and Machine Learning00.342020
Fast Electromagnetic Transient Simulation Based on Hierarchical Low-Rank Approximation00.342019
Capacitance Extraction With Provably Good Absorbing Boundary Conditions.00.342018
Research on the DFT of ZC Sequence in TD-LTE System.00.342016
Fast compressive sensing reconstruction algorithm on FPGA using Orthogonal Matching Pursuit20.382016
Macro Model of Advanced Devices for Parasitic Extraction.00.342016
Low-Complexity Carrier Frequency Offset Estimation Algorithm in TD-LTE.20.542013
$O(mn)$ Time Algorithm for Optimal Buffer Insertion of Nets With $m$ Sinks30.412012
Lagrangian relaxation for gate implementation selection30.402011
Numerical simulation of viscous flow over non-smooth surfaces00.342011
Ultra-fast interconnect driven cell cloning for minimizing critical path delay20.392010
Fast characterization of parameterized cell library10.432009
The impact of BEOL lithography effects on the SRAM cell performance and yield60.542009
Inductance Extraction for Interconnects in the Presence of Nonlinear Magnetic Materials00.342009
SRAM methodology for yield and power efficiency: per-element selectable supplies and memory reconfiguration schemes10.372008
A Preconditioned Hierarchical Algorithm for Impedance Extraction of Three-Dimensional Structures With Multiple Dielectrics60.552008
Circuit-wise buffer insertion and gate sizing algorithm with scalability30.452008
Multi-scenario buffer insertion in multi-core processor designs20.392008
Buffering Interconnect for Multicore Processor Designs10.452008
Wire Sizing for Non-Tree Topology100.692007
Fast capacitance extraction in multilayer, conformal and embedded dielectric using hybrid boundary element method20.442007
An O(bn2) time algorithm for optimal buffer insertion with b buffer types90.632007
A new twisted differential line structure in global bus design20.372007
Impedance extraction for 3-D structures with multiple dielectrics using preconditioned boundary element method50.492007
An Efficient Algorithm for RLC Buffer Insertion00.342007
A New Methodology for Interconnect Parasitics Extraction Considering Photo-Lithography Effects70.792007
Probabilistic Congestion Prediction with Partial Blockages50.522007
Path-Based Buffer Insertion10.412007
An O(Bn(2)) Time Algorithm For Optimal Buffer Insertion With B Buffer Types120.792006
A New RLC Buffer Insertion Algorithm30.412006
Model order reduction of linear networks with massive ports via frequency-dependent port packing150.792006
An O(mn) time algorithm for optimal buffer insertion of nets with m sinks90.772006
Fast algorithms for slew constrained minimum cost buffering442.022006
An Efficient, Scalable Hardware Engine for Boolean SATisfiability20.392006
Fast 3-D Capacitance Extraction by Inexact Factorization and Reduction10.382006
A fast algorithm for optimal buffer insertion241.182005
Sparse transformations and preconditioners for 3-D capacitance extraction50.662005
A vector-based approach for power supply noise analysis in test compaction.191.062005
Static Compaction of Delay Tests Considering Power Supply Noise90.552005
The rectilinear Steiner arborescence problem is NP-complete271.482005
Path based buffer insertion201.292005
Making fast buffer insertion even faster via approximation techniques160.892005
K Longest Paths Per Gate (KLPG) Test Generation for Scan-Based Sequential Circuits723.052004
A statistical fault coverage metric for realistic path delay faults140.892004
A divide-and-conquer algorithm for 3-D capacitance extraction30.522004
A Divide-and-Conquer Algorithm for 3D Capacitance Extraction20.432004
Sparse transformations and preconditioners for hierarchical 3-D capacitance extraction with multiple dielectrics40.632004
A circuit level fault model for resistive shorts of MOS gate oxide40.572004
Minimum moment Steiner trees20.452004
PARADE: PARAmetric Delay Evaluation under Process Variation40.472004
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