Author Info
Name
Affiliation
Papers
D. LACHENAL
STMicroelectronics, 850 rue Jean Monnet, 38926 Crolles Cedex, France
2
Collaborators
Citations 
PageRank 
6
1
0.82
Referers 
Referees 
References 
5
6
1
Title
Citations
PageRank
Year
Degradation mechanism understanding of NLDEMOS SOI in RF applications10.482007
Hot-carrier reliability of 20V MOS transistors in 0.13 mum CMOS technology00.342005