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SEIJI INUMIYA
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SEIJI INUMIYA
2
13
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0
0.68
0
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0
0
Publications (2 rows)
Collaborators (13 rows)
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Referees (0 rows)
Title
Citations
PageRank
Year
Time-dependent dielectric breakdown (TDDB) distribution in n-MOSFET with HfSiON gate dielectrics under DC and AC stressing.
0
0.34
2013
Evaluation Of Dielectric Reliability Of Ultrathin Hfsioxny In Metal-Gate Capacitors
0
0.34
2007
1