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JEAN-LUC OGIER
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Name
Affiliation
Papers
JEAN-LUC OGIER
Aix Marseille Univ, IM2NP, UMR CNRS 7334, 38 Rue Frederic Joliot Curie, F-13451 Marseille, France
9
Collaborators
Citations
PageRank
33
3
3.38
Referers
Referees
References
11
84
16
Publications (9 rows)
Collaborators (33 rows)
Referers (11 rows)
Referees (84 rows)
Title
Citations
PageRank
Year
Physically-based evaluation of aging contributions in HC/FN-programmed 40 nm NOR Flash technology.
0
0.34
2017
Impact of endurance degradation on the programming efficiency and the energy consumption of NOR flash memories.
0
0.34
2014
Effect of ions presence in the SiOCH inter metal dielectric structure
0
0.34
2013
Access resistor modelling for EEPROM's retention test vehicle.
0
0.34
2013
Effects Of Lightly Doped Drain And Channel Doping Variations On Flash Memory Performances And Reliability
0
0.34
2012
Investigation of the effects of constant voltage stress on thin SiO2 layers using dynamic measurement protocols.
0
0.34
2012
Matching degradation of threshold voltage and gate voltage of NMOSFET after Hot Carrier Injection stress.
1
0.40
2011
Influence of various process steps on the reliability of PMOSFETs submitted to negative bias temperature instabilities
1
0.47
2009
Oxide reliability below 3 nm for advanced CMOS: Issues, characterization, and solutions
1
0.47
2007
1