Author Info
Name
Affiliation
Papers
HOUNG-CHI WEI
Powerchip Semiconductor Corporation, HsinChu 300, Taiwan ROC
2
Collaborators
Citations 
PageRank 
17
0
0.68
Referers 
Referees 
References 
0
0
0
Title
Citations
PageRank
Year
Comparison of Electrical and Reliability Characteristics of Different Tunnel Oxides in SONOS Flash Memory00.342006
Detailed Comparisons of Program, Erase and Data Retention Characteristics between P+- and N+-Poly SONOS NAND Flash Memory00.342006