Author Info
Name
Affiliation
Papers
S. MELI
Departament Enginyeria Electrònica, Universitat Autònoma de Barcelona, Edifici Q, 08193 Bellaterra, Spain
1
Collaborators
Citations 
PageRank 
3
0
0.34
Referers 
Referees 
References 
0
0
0
Title
Citations
PageRank
Year
Pre-breakdown noise in electrically stressed thin SiO2 layers of MOS devices observed with C-AFM00.342003