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JEAN-YVES DELÉTAGE
Author Info
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Name
Affiliation
Papers
JEAN-YVES DELÉTAGE
Univ Bordeaux, IMS, UMR 5218, F-33400 Talence, France
11
Collaborators
Citations
PageRank
29
15
5.68
Referers
Referees
References
50
45
12
Publications (11 rows)
Collaborators (29 rows)
Referers (50 rows)
Referees (45 rows)
Title
Citations
PageRank
Year
Efficient state of health estimation of Li-ion battery under several ageing types for aeronautic applications.
0
0.34
2018
Creep measurement and choice of creep laws for BGA assemblies' reliability simulation.
0
0.34
2018
Sequential combined thermal cycling and vibration test and simulation of printed circuit board.
0
0.34
2018
Effect of HTRB lifetest on AlGaN/GaN HEMTs under different voltages and temperatures stresses.
0
0.34
2018
Effects of ageing on the conducted immunity of a voltage reference: Experimental study and modelling approach.
0
0.34
2017
Effects of salt spray test on lead-free solder alloy.
0
0.34
2016
Electrical characterization under mechanical stress at various temperatures of PiN power diodes in a health monitoring approach.
0
0.34
2013
Conductive adhesive joint for extreme temperature applications.
2
0.47
2013
A preliminary study on the thermal and mechanical performances of sintered nano-scale silver die-attach technology depending on the substrate metallization.
3
0.84
2012
How supercapacitors reach end of life criteria during calendar life and power cycling tests.
4
0.60
2011
Ageing monitoring of lithium-ion cell during power cycling tests.
6
1.40
2011
1