Author Info
Name
Affiliation
Papers
M. ULLÁN
Centro Nacional de Microelectrónica (CNM-CSIC), Campus UAB, 08193 Bellaterra, Barcelona, Spain
4
Collaborators
Citations 
PageRank 
30
1
1.64
Referers 
Referees 
References 
10
0
0
Title
Citations
PageRank
Year
Mechanism of anomalous recovery in advanced SiGe bipolar transistors after low dose rate irradiation for very high total doses.00.342014
Simulation methodology for dose effects in lateral DMOS transistors00.342012
Test structure assembly for bump bond yield measurement on high density flip chip technologies00.342006
Electrical characteristics of high-energy proton irradiated ultra-thin gate oxides10.632002