Author Info
Name
Affiliation
Papers
E. SCIACCA
CNR-IMM, Stradale Primosole, 50, 95121 Catania, Italy
1
Collaborators
Citations 
PageRank 
7
5
0.56
Referers 
Referees 
References 
14
0
0
Title
Citations
PageRank
Year
Measurement of the hot carrier damage profile in LDMOS devices stressed at high drain voltage50.562007