Author Info
Name
Affiliation
Papers
JEAN-BAPTISTE GROS
Université Bordeaux1, Laboratoire IMS, 351, cours de la Libération, 33405 Talence, France
2
Collaborators
Citations 
PageRank 
4
7
1.99
Referers 
Referees 
References 
19
5
2
Title
Citations
PageRank
Year
Control of the electromagnetic compatibility: An issue for IC reliability.30.632011
Electromagnetic immunity model of an ADC for microcontroller’s reliability improvement41.362009