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KIKUO YAMABE
Author Info
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Name
Affiliation
Papers
KIKUO YAMABE
University of Tsukuba, 1-1-1 Tennodai, Tsukuba, Ibaraki 305-8572, Japan
4
Collaborators
Citations
PageRank
26
0
1.35
Referers
Referees
References
0
16
3
Publications (4 rows)
Collaborators (26 rows)
Referers (0 rows)
Referees (16 rows)
Title
Citations
PageRank
Year
Verification of Copper Stress Migration Under Low Temperature Long Time Stress
0
0.34
2019
Mechanism of gate dielectric degradation by hydrogen migration from the cathode interface.
0
0.34
2017
Formation mechanism of concave by dielectric breakdown on silicon carbide metal-oxide-semiconductor capacitor
0
0.34
2016
Time-dependent dielectric breakdown (TDDB) distribution in n-MOSFET with HfSiON gate dielectrics under DC and AC stressing.
0
0.34
2013
1
