Author Info
Name
Affiliation
Papers
HIROSHI TSUTSUI
Kyoto University, Yoshida-hon-machi, Sakyo, Kyoto, Japan
2
Collaborators
Citations 
PageRank 
7
12
1.12
Referers 
Referees 
References 
55
43
15
Title
Citations
PageRank
Year
Hot-swapping architecture with back-biased testing for mitigation of permanent faults in functional unit array10.372013
Sequential importance sampling for low-probability and high-dimensional SRAM yield analysis110.752010