Author Info
Name
Affiliation
Papers
YVES BERTRAND
LIRMM, Montpellier II / CNRS, France
3
Collaborators
Citations 
PageRank 
15
34
2.44
Referers 
Referees 
References 
48
33
22
Title
Citations
PageRank
Year
Remote Labs for Industrial IC Testing30.772009
Topological model for two-dimensional image representation: definition and optimal extraction algorithm311.332004
Digital, Memory and Mixed-Signal Test Engineering Education: Five Centres of Competence in Europe00.342004