Simplification of sub-gap density of states extraction method for amorphous In-Ga-Zn-O thin-film transistors by a single capacitance-voltage curve. | 0 | 0.34 | 2018 |
Corrigendum to "A subgap density of states modeling for the transient characteristics in oxide-based thin-film transistors" [Microelectron. Reliab. 60 (2016) 67-69]. | 0 | 0.34 | 2016 |
A subgap density of states modeling for the transient characteristics in oxide-based thin-film transistors. | 0 | 0.34 | 2016 |