Author Info
Name
Affiliation
Papers
KARL RUPP
Institute for Microelectronics, Technische Universität Wien, 1040 Wien, Austria
1
Collaborators
Citations 
PageRank 
8
0
0.34
Referers 
Referees 
References 
0
9
3
Title
Citations
PageRank
Year
Comparison of analytic distribution function models for hot-carrier degradation modeling in nLDMOSFETs00.342015