Author Info
Name
Affiliation
Papers
L. THEOLIER
Univ Bordeaux, IMS, UMR 5218, F-33400 Talence, France
3
Collaborators
Citations 
PageRank 
13
0
1.01
Referers 
Referees 
References 
0
23
5
Title
Citations
PageRank
Year
Effect of HTRB lifetest on AlGaN/GaN HEMTs under different voltages and temperatures stresses.00.342018
Power electronic assemblies: Thermo-mechanical degradations of gold-tin solder for attaching devices.00.342016
Electrical characterization under mechanical stress at various temperatures of PiN power diodes in a health monitoring approach.00.342013