Time-dependent dielectric breakdown (TDDB) distribution in n-MOSFET with HfSiON gate dielectrics under DC and AC stressing. | 0 | 0.34 | 2013 |
Pronunciation variant analysis using speaking style parallel corpus | 0 | 0.34 | 2001 |
Designing a domain independent platform of spoken dialogue system | 0 | 0.34 | 2000 |