Author Info
Name
Affiliation
Papers
BRAD D. GAYNOR
Department of Electrical and ComputerEngineering, Tufts University, Medford, MA 02155 USA.|c|
1
Collaborators
Citations 
PageRank 
1
0
0.34
Referers 
Referees 
References 
0
5
1
Title
Citations
PageRank
Year
Simulation Methodology and Evaluation of Through Silicon Via (TSV)-FinFET Noise Coupling in 3-D Integrated Circuits00.342015