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C. Q. CHEN
Author Info
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Name
Affiliation
Papers
C. Q. CHEN
Globalfoundries Singapore Pte. Ltd.60 Woodlands Industrial Park D Street 2738406Singapore
7
Collaborators
Citations
PageRank
40
0
2.37
Referers
Referees
References
0
14
2
Publications (7 rows)
Collaborators (40 rows)
Referers (0 rows)
Referees (14 rows)
Title
Citations
PageRank
Year
Failure analysis methodology on donut pattern failure due to photovoltaic electrochemical effect.
0
0.34
2017
Embed SRAM IDDOFF fail root cause identification by combination of device analysis and localized circuit analysis.
0
0.34
2017
In-depth circuits edit analysis to reveal the implantation-related defect.
0
0.34
2017
Application of Scanning Capacitance Microscopy on SOI device with wafer edge low yield pattern.
0
0.34
2017
Cross-sectional nanoprobing fault isolation technique on submicron devices.
0
0.34
2016
Application of Fast Laser Deprocessing Techniques on large cross-sectional view area sample with FIB-SEM dual beam system.
0
0.34
2016
Electrical analysis on implantation-related defect by nanoprobing methodology.
0
0.34
2016
1