Author Info
Name
Affiliation
Papers
A. DURIER
Inst Rech Technol St Exupery, F-31432 Toulouse, France
4
Collaborators
Citations 
PageRank 
14
0
1.35
Referers 
Referees 
References 
0
29
7
Title
Citations
PageRank
Year
Effect of HTRB lifetest on AlGaN/GaN HEMTs under different voltages and temperatures stresses.00.342018
Simulation and modelling of long term reliability of digital circuits implemented in FPGA.00.342018
Effects of ageing on the conducted immunity of a voltage reference: Experimental study and modelling approach.00.342017
A methodologic project to characterize and model COTS component reliability00.342015