Author Info
Name
Affiliation
Papers
MOSHE EIZENBERG
Technion Israel Inst Technol, Dept Mat Sci & Engn, IL-32000 Haifa, Israel
2
Collaborators
Citations 
PageRank 
2
1
0.77
Referers 
Referees 
References 
4
18
5
Title
Citations
PageRank
Year
Influence of gate oxides with high thermal conductivity on the failure distribution of InGaAs-based MOS stacks.00.342016
General features of progressive breakdown in gate oxides: A compact model10.432015