Author Info
Name
Affiliation
Papers
TAO CHEN
Department of Electrical and Computer Engineering, Iowa State University, Ames, IA, USA
2
Collaborators
Citations 
PageRank 
6
0
0.68
Referers 
Referees 
References 
0
15
5
Title
Citations
PageRank
Year
An Ultrafast Multibit/Stage Pipelined ADC Testing and Calibration Method00.342020
Accurate linearity testing with impure sinusoidal stimulus robust against flicker noise00.342016