| DCG-FGT transistor: Retention study of Floating Gate charge | 0 | 0.34 | 2013 |
| Investigation of the effects of constant voltage stress on thin SiO2 layers using dynamic measurement protocols. | 0 | 0.34 | 2012 |
| PSP based DCG-FGT transistor model including characterization procedure. | 0 | 0.34 | 2011 |
| Mm11 Based Flash Memory Cell Model Including Characterization Procedure | 2 | 0.91 | 2006 |
| Decreasing EEPROM programming bias with negative voltage, reliability impact | 0 | 0.34 | 2002 |
