Author Info
Name
Affiliation
Papers
H. P. NG
Product, Test and Failure AnalysisGlobalfoundriesSingapore
2
Collaborators
Citations 
PageRank 
13
0
0.68
Referers 
Referees 
References 
0
0
0
Title
Citations
PageRank
Year
Embed SRAM IDDOFF fail root cause identification by combination of device analysis and localized circuit analysis.00.342017
Electrical analysis on implantation-related defect by nanoprobing methodology.00.342016