| Minimization of test time in system on chip using artificial intelligence-based test scheduling techniques | 3 | 0.47 | 2020 |
| Entropy Based Illumination-Invariant Foreground Detection | 0 | 0.34 | 2019 |
| Test data compression for digital circuits using tetrad state skip scheme. | 0 | 0.34 | 2017 |
