Author Info
Name
Affiliation
Papers
YUAN LI
Shanghai Institute of Measurement and Testing Technology, Shanghai, China
1
Collaborators
Citations 
PageRank 
4
0
0.34
Referers 
Referees 
References 
0
0
0
Title
Citations
PageRank
Year
Lateral characteristic calibration of an atomic force microscope using a Cr atomic deposition grating00.342021