Author Info
Name
Affiliation
Papers
S. P. NEO
Product, Test & Failure AnalysisGLOBALFOUNDRIES Singapore Pte Ltd.Singapore
1
Collaborators
Citations 
PageRank 
7
1
0.63
Referers 
Referees 
References 
10
2
1
Title
Citations
PageRank
Year
Static fault localization of subtle metallization defects using near infrared photon emission microscopy.10.632017