Author Info
Name
Affiliation
Papers
CHUNG-HUANG YEH
Department of Electrical Engineering, National Central University, Taoyuan County 32001, Taiwan (R.O.C.)
1
Collaborators
Citations 
PageRank 
1
0
0.34
Referers 
Referees 
References 
0
0
0
Title
Citations
PageRank
Year
The Decision Mechanism Uses the Multiple-Tests Scheme to Improve Test Yield in IC Testing00.342020