Author Info
Name
Affiliation
Papers
JEN-HSUAN TSOU
Department of Industrial Engineering and Management, National Taipei University of Technology, Taipei, Taiwan
1
Collaborators
Citations 
PageRank 
5
0
0.34
Referers 
Referees 
References 
0
35
14
Title
Citations
PageRank
Year
Key Feature Identification for Monitoring Wafer-to-Wafer Variation in Semiconductor Manufacturing00.342022