Author Info
Name
Affiliation
Papers
JEFFERY LAM
Product, Test and Failure AnalysisGlobalfoundriesSingapore
2
Collaborators
Citations 
PageRank 
11
0
0.68
Referers 
Referees 
References 
0
6
1
Title
Citations
PageRank
Year
Application of Scanning Capacitance Microscopy on SOI device with wafer edge low yield pattern.00.342017
Electrical analysis on implantation-related defect by nanoprobing methodology.00.342016