Author Info
Name
Affiliation
Papers
YI-LUN TANG
Novatek Microelectronics Corporation, Taiwan
1
Collaborators
Citations 
PageRank 
8
0
0.34
Referers 
Referees 
References 
0
0
0
Title
Citations
PageRank
Year
Test Methodology for Defect-based Bridge Faults00.342020